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IEC 61445 (2012-06)
IEC 61445:2012 Digital Test Interchange Format (DTIF)More info
IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.
| Author | International Electrotechnical Commission (IEC) |
|---|---|
| Published by | IEC |
| Document type | Standard |
| Format | File |
| Edition | 1.0 |
| ICS | 25.040.01 : Industrial automation systems in general 35.060 : Languages used in information technology |
| Number of pages | 101 |
| Replace | IEC 93/321/FDIS (2011-12) |
| Cross references | BS IEC 61445 (2013-05-31), IDT |
| Year | 2012 |
| Document history | IEC 61445 (2012-06) |
| Country | Switzerland |
| Keyword | IEC61445;IEC 61445:2012 |