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IEC 60749-27 AMD 1 (2012-09)
IEC 60749-27:2006/AMD1:2012 Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)More info
| Author | International Electrotechnical Commission (IEC) |
|---|---|
| Published by | IEC |
| Document type | Norms amendments |
| Format | File |
| Edition | 2.0 |
| ICS | 31.080.01 : Semiconductor devices in general |
| Number of pages | 5 |
| Replace | IEC 47/2135/FDIS (2012-06) |
| Cross references | DIN EN 60749-27 (2013-04), IDT |
| Modify | IEC 60749-27 (2006-07) |
| Year | 2012 |
| Document history | IEC 60749-27 AMD 1 (2012-09) |
| Country | Switzerland |
| Keyword | IEC60749;IEC 60749-27:2006/AMD1:2012 |