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IEC 60444-2 (1980-01)
IEC 60444-2:1980 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal unitsMore info
Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Standard |
| Format | File |
| Edition | 1.0 |
| ICS | 31.140 : Piezoelectric devices |
| Number of pages | 18 |
| Cross references | DIN 45105-5 (1987-03), IDT |
| Year | 1980 |
| Document history | |
| Country | Switzerland |
| Keyword | IEC60444;IEC 60444-2:1980 |