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IEC 60759 (1983-01)
IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometersMore info
Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Standard |
| Format | File |
| Edition | 1.0 |
| ICS | 17.240 : Radiation measurements |
| Number of pages | 97 |
| Cross references | DIN IEC 75(CO)9 (1981-07), IDT |
| Modified by | IEC 60759 AMD 1 (1991-11) |
| Year | 1980 |
| Document history | |
| Country | Switzerland |
| Keyword | IEC60759;IEC 60759:1983 |