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Applies to encapsulated semiconductor integrated circuits, including multichip integrated circuits, but excluding hybrid circuits. Gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor integrated circuits, including digital, analogue and interface circuits.
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Standard |
| Format | File |
| Edition | 1.0 |
| ICS | 31.200 : Integrated circuits. Microelectronics |
| Number of pages | 63 |
| Cross references | BS IEC 60748-11 (1991-09-30), IDT |
| Modified by | IEC 60748-11 AMD 2 (1999-04) IEC 60748-11 AMD 1 (1995-06) |
| Year | 1990 |
| Document history | |
| Country | Switzerland |
| Keyword | IEC60748;IEC 60748-11:1990 |