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IEC 60748-3-1 (1991-08)
IEC 60748-3-1:1991 Semiconductor devices. Integrated circuits - Part 3: Analogue integrated circuits - Section one: Blank detail specification for monolithic integrated operational amplifiersMore info
Defines quality assessment procedures in such a manner that electronic components are acceptable in all other participating countries without the need for further testing. Refers to IEC 747-10/QC 700000.
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Standard |
| Format | File |
| Edition | 1.0 |
| ICS | 31.200 : Integrated circuits. Microelectronics |
| Number of pages | 33 |
| Cross references | DIN IEC 60748-3-1 (1994-01), IDT |
| Year | 1990 |
| Document history | |
| Country | Switzerland |
| Keyword | IEC60748;IEC 60748-3-1:1991 |