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IEC 60759 AMD 1 (1991-11)
IEC 60759:1983/AMD1:1991 Amendment 1 - Standard test procedures for semiconductor X-ray energy spectrometersMore info
Replaces one sentence in sub-clause 7.4.1 (page 55) and the Figure 15a (page 94).
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Norms amendments |
| Format | File |
| Edition | 1.0 |
| ICS | 17.240 : Radiation measurements |
| Number of pages | 4 |
| Cross references | SS-IEC 759 (1994-09-30), IDT |
| Modify | IEC 60759 (1983) |
| Year | 1990 |
| Document history | |
| Country | Switzerland |
| Keyword | IEC60759;IEC 60759:1983/AMD1:1991 |