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IEC 60748-11-1 (1992-04)
IEC 60748-11-1:1992 Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuitsMore info
The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Standard |
| Format | File |
| Edition | 1.0 |
| ICS | 31.200 : Integrated circuits. Microelectronics |
| Number of pages | 71 |
| Cross references | BS QC 790101 (1992-08-15), IDT |
| Year | 1990 |
| Document history | |
| Country | Switzerland |
| Keyword | IEC60748;IEC 60748-11-1:1992 |