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Adds in Table III, sub-group C1B, subclause 4.20 Bump in 'Conditions of test' after 'Number of bumps: 4 000': 'or Acceleration: 98 m/s2, Number of bumps: 1 000'.
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Norms amendments |
| Format | File |
| Edition | 1.0 |
| ICS | 31.040.10 : Fixed resistors |
| Number of pages | 3 |
| Cross references | BS QC 400201 (1984-01-15), IDT |
| Modify | IEC 60115-4-1 (1983) |
| Year | 1990 |
| Document history | |
| Country | Switzerland |
| Keyword | IEC60115;IEC 60115-4-1:1983/AMD1:1993 |