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Describes the test procedure intended to characterise the level of unwanted signals caused by the presence of two or more transmitting signals in waveguides or waveguide assemblies.
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Standard |
| Format | File |
| Edition | 1.0 |
| ICS | 17.220.01 : Electricity. Magnetism. General aspects 33.120.10 : Coaxial cables. Waveguides |
| Number of pages | 17 |
| Replace | IEC 46B/207/FDIS (1996-02) |
| Cross references | DIN EN 61580-2 (1997-05), IDT |
| Year | 1990 |
| Document history | IEC 61580-2 (1996-06) |
| Country | Switzerland |
| Keyword | IEC61580;IEC 61580-2:1996 |