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Defines test methods for immunity to ripple at the d.c. input power port of electrical or electronic equipment. Applies to low-voltage d.c. power ports of equipment supplied by external rectifier systems, or batteries which are being charged. This standard defines - test voltage waveform; - range of test levels; - test generator; - test set-up; - test procedure.
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Standard |
| Format | File |
| Edition | 1.0 |
| ICS | 33.100.20 : Immunity |
| Number of pages | 27 |
| Replace | IEC 77A/207/CDV (1997-08) |
| Cross references | DIN EN 61000-4-17 (2000-02), IDT |
| Modified by | IEC 61000-4-17 AMD 2 (2008-11) IEC 61000-4-17 AMD 1 (2001-07) |
| Year | 1990 |
| Document history | IEC 61000-4-17 (1999-06) |
| Country | Switzerland |
| Keyword | IEC61000;IEC 61000-4-17:1999 |