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The contents of the corrigendum of January 2000 have been included in this copy.
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Standard |
| Format | File |
| Edition | 1.0 |
| ICS | 31.080.01 : Semiconductor devices in general |
| Number of pages | 28 |
| Replace | IEC 47D/282/FDIS (1999-04) |
| Cross references | CSN IEC 60191-2X (2000-08-01), IDT |
| Modify | IEC 60191-2 (1966) |
| Modified by | IEC 60191-2X Corrigendum 1 (2000-01) |
| Year | 1990 |
| Document history | IEC 60191-2X (1999-09) |
| Country | Switzerland |
| Keyword | IEC60191;IEC 60191-2X:1999 |