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Defines a high order language for electronics testing independent of any specific test system. Can be implemented on automatic test equipement (ATE)
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Standard |
| Format | File |
| Edition | 1.0 |
| ICS | 35.240.50 : IT applications in industry |
| Number of pages | 602 |
| Year | 1990 |
| Country | International |
| Keyword | IEC61926;IEC 61926-1:1999 |