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Establishes the characteristics of standard evaluation components (SEC) used for verifying capability and reliability.
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Standard |
| Format | File |
| Edition | 1.0 |
| ICS | 31.200 : Integrated circuits. Microelectronics |
| Number of pages | 15 |
| Replace | IEC 47A/522/CDV (1998-04) |
| Cross references | NPR-IEC/TS 61944:2000 en |
| Year | 2000 |
| Document history | IEC/TS 61944 (2000-01) |
| Country | Switzerland |
| Keyword | IEC61944;IEC TS 61944:2000 |