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IEC/TS 61945 (2000-03)
IEC TS 61945:2000 Interated circuits - Manufacturing line approval - Methodology for technology and failure analysisMore info
Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Standard |
| Format | File |
| Edition | 1.0 |
| ICS | 31.200 : Integrated circuits. Microelectronics |
| Number of pages | 23 |
| Replace | IEC 47A/523/CDV (1998-04) |
| Cross references | NPR-IEC/TS 61945:2000 en |
| Year | 2000 |
| Document history | IEC/TS 61945 (2000-03) |
| Country | Switzerland |
| Keyword | IEC61945;IEC TS 61945:2000 |