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IEC 62047-17 (2015-03)

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IEC 62047-17 (2015-03)

IEC 62047-17:2015 Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films

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IEC 62047-17:2015 specifies the method for performing bulge tests on the free-standing film that is bulged within a window. The specimen is fabricated with micro/nano structural film materials, including metal, ceramic and polymer films, for MEMS, micromachines and others. The thickness of the film is in the range of 0,1 µ to 10 µ, and the width of the rectangular and square membrane window and the diameter of the circular membrane range from 0,5 mm to 4 mm. The tests are carried out at ambient temperature, by applying a uniformly-distributed pressure to the testing film specimen with bulging window. Elastic modulus and residual stress for the film materials can be determined with this method.

Author IEC
Editor CEI
Document type Standard
Format File
Edition 1.0
ICS 31.080.99 : Other semiconductor devices
Number of pages 54
Replace IEC 47F/210/FDIS (2014-12)
Cross references DIN EN 62047-17 (2015-12), IDT
Year 2015
Document history IEC 62047-17 (2015-03)
Country Switzerland
Keyword IEC62047;IEC 62047-17:2015