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IEC 62047-17:2015 specifies the method for performing bulge tests on the free-standing film that is bulged within a window. The specimen is fabricated with micro/nano structural film materials, including metal, ceramic and polymer films, for MEMS, micromachines and others. The thickness of the film is in the range of 0,1 µ to 10 µ, and the width of the rectangular and square membrane window and the diameter of the circular membrane range from 0,5 mm to 4 mm. The tests are carried out at ambient temperature, by applying a uniformly-distributed pressure to the testing film specimen with bulging window. Elastic modulus and residual stress for the film materials can be determined with this method.
Author | IEC |
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Editor | CEI |
Document type | Standard |
Format | File |
Edition | 1.0 |
ICS | 31.080.99 : Other semiconductor devices |
Number of pages | 54 |
Replace | IEC 47F/210/FDIS (2014-12) |
Cross references | DIN EN 62047-17 (2015-12), IDT |
Year | 2015 |
Document history | IEC 62047-17 (2015-03) |
Country | Switzerland |
Keyword | IEC62047;IEC 62047-17:2015 |