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IEC/TR 62878-2-2 (2015-12)
IEC TR 62878-2-2:2015 Device embedded substrate - Part 2-2: Guidelines - Electrical testingMore info
IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Standard |
| Format | File |
| Edition | 1.0 |
| ICS | 31.180 : Printed circuits and boards 31.190 : Electronic component assemblies |
| Number of pages | 29 |
| Replace | IEC 91/1220/DTR (2014-10) |
| Cross references | PD IEC/TR 62878-2-2 (2015-12-31), IDT |
| Year | 2015 |
| Document history | IEC/TR 62878-2-2 (2015-12) |
| Country | Switzerland |
| Keyword | IEC62878;IEC TR 62878-2-2:2015 |