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IEC 62899-402-1 (2017-03)

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IEC 62899-402-1 (2017-03)

IEC 62899-402-1:2017 Printed electronics - Part 402-1: Printability - Measurement of qualities - Pattern width

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IEC 62899-402-1:2017(E) specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.
 

Author IEC
Editor CEI
Document type Standard
Format File
Edition 1.0
ICS 31.180 : Printed circuits and boards
Number of pages 12
Year 2017
Country International
Keyword IEC62899;IEC 62899-402-1:2017