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IEC 60749-43 (2017-06)
IEC 60749-43:2017 Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plansMore info
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Standard |
| Format | File |
| Edition | 1.0 |
| ICS | 31.080.01 : Semiconductor devices in general |
| Number of pages | 74 |
| Year | 2017 |
| Country | Switzerland |
| Keyword | IEC60749;IEC 60749-43:2017 |