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IEC/TR 63133 (2017-10)
IEC TR 63133:2017 Semiconductor devices - Scan based ageing level estimation for semiconductor devicesMore info
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Standard |
| Format | File |
| Edition | 1.0 |
| ICS | 31.080.01 : Semiconductor devices in general |
| Number of pages | 17 |
| Year | 2017 |
| Country | International |
| Keyword | IEC63133;IEC TR 63133:2017 |