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IEC 60749-12 (2017-12)
IEC 60749-12:2017 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequencyMore info
IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages
This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.
| Author | IEC |
|---|---|
| Editor | CEI |
| Document type | Standard |
| Format | File |
| Edition | 2.0 |
| ICS | 31.080.01 : Semiconductor devices in general |
| Number of pages | 14 |
| Replace | IEC 60749-12 Corrigendum 1 (2003-08) IEC 60749-12 (2002-04) |
| Year | 2017 |
| Document history | IEC 60749-12 (2002-04) IEC 60749-12 Corrigendum 1 (2003-08) IEC 60749- |
| Country | Switzerland |
| Keyword | IEC60749;IEC 60749-12:2017 |