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EIA-323:1966 (R2002)
Air-Convection-Cooled Life Test Environment for Lead-Mounted Semiconductor DevicesMore info
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2002-11-01 |
| ICS | 31.080.01 : Semiconductor devices in general |
| Number of pages | 6 |
| Year | 1960 |
| Document history | |
| Country | USA |
| Keyword | EIA 323;323 |