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EIA JESD 6:1967 (R2002)
Measurement of Small Values of Transistor CapacitanceMore info
This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2002-10-01 |
| ICS | 31.080.30 : Transistors |
| Number of pages | 17 |
| Year | 1960 |
| Document history | |
| Country | USA |
| Keyword | EIA 6;6;EIA JESD6 |