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EIA CB-5-1:1971
Recommended Test Procedure for Semiconductor Thermal Dissipating DevicesMore info
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 31.080.01 : Semiconductor devices in general |
| Number of pages | 14 |
| Modify | EIA CB-5 (1969-07) |
| Year | 1970 |
| Document history | |
| Country | USA |
| Keyword | EIA CB-5;EIA 5;EIA 5.1;5;EIA CB 5-1 |