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EIA JESD 25:1972 (R2002)
Measurement of Small-Signal Transistor Scattering ParametersMore info
This standard provides a test method and definition for small-signal conditions at microwave frequencies.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2002-10-01 |
| ICS | 31.080.30 : Transistors |
| Number of pages | 32 |
| Year | 1970 |
| Document history | |
| Country | USA |
| Keyword | EIA 25;25;EIA JESD25 |