Cart 0 Product Products (empty)
No products
To be determined Shipping
$0.00 Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart. There is 1 item in your cart.
Total products
Total shipping To be determined
Total
New Sale! 
View larger
View larger EIA JEP 115:1989 (R1999)
New product
EIA JEP 115:1989 (R1999)
Power MOSFET Electrical Dose Rate Test MethodMore info
The purpose of this Test Method is to establish electrical criteria for comparing and specifying power MOSFET performance under high dose rate radiation.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 1999-04-01 |
| ICS | 17.220.01 : Electricity. Magnetism. General aspects |
| Number of pages | 9 |
| Year | 1980 |
| Document history | |
| Country | USA |
| Keyword | EIA 115;115;EIA JEP115 |