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The method described in this document applies to all reliability mechanisms associated with electronic components. The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic components.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2011-01-01 |
| ICS | 31.020 : Electronic components in general |
| Number of pages | 20 |
| Replace | EIA JESD 91 (2001-12) |
| Year | 2003 |
| Document history | EIA JESD 91A (2003-08) |
| Country | USA |
| Keyword | EIA 91A;91A;EIA JESD91A |