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EIA JEP 119A:2003 (R2012)
A Procedure for Performing SWEATMore info
This document describes an algorithm for performing the Standard Wafer Level Electromigration Accelerated Test (SWEAT) method with computer controlled instrumentation. The algorithm requires a separate iterative technique (not provided) to calculate the force current for a given target time to failure. This document does not specify what test structure to use with this procedure. However, users of this algorithm report its effectiveness on both straight-lines and via-terminated test structures. Some teststructures design features are provided in JESD87 and in ASTM 1259M - 96.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2012-10-01 |
| ICS | 33.020 : Telecommunications in general |
| Number of pages | 32 |
| Replace | EIA JEP 119 (1994) |
| Year | 2003 |
| Document history | EIA JEP 119A (2003-08) |
| Country | USA |
| Keyword | EIA 119A;119A;EIA JEP119A |