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EIA JESD 203:2005
Standard Test Loads For Dual - Supply Level Translation DevicesMore info
This standard defines ac test loads for dual-supply level translation devices. Uniform test loads enable easy comparison of electrical parameters of dual-supply level translation devices across functions, logic families and IC suppliers. This standard is only intended to apply to devices released subsequent to th
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 19.080 : Electrical and electronic testing |
| Number of pages | 10 |
| Year | 2005 |
| Document history | |
| Country | USA |
| Keyword | EIA 203;203;EIA JESD203 |