Cart 0 Product Products (empty)
No products
To be determined Shipping
$0.00 Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart. There is 1 item in your cart.
Total products
Total shipping To be determined
Total
New Sale! 
View larger
View larger EIA JESD 51-2A:2008
New product
EIA JESD 51-2A:2008
Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)More info
This document outlines the environmental conditions necessary to ensure accuracy and repeatability for a standard junction-to-ambient thermal resistance measurement in natural convection.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 31.200 : Integrated circuits. Microelectronics |
| Number of pages | 22 |
| Replace | EIA JESD 51-2 (1995) |
| Year | 2008 |
| Document history | EIA JESD 51-2A (2008-01) |
| Country | USA |
| Keyword | EIA JESD 51;EIA 51;EIA 51.2A;51;EIA JESD51-2A |