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EIA-970:2013
Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip CapacitorsMore info
This test method is used to measure the S parameters of low-inductance multilayer ceramic capacitors when mounted in shunt on a probeable low inductance test fixture.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2013-07-01 |
| ICS | 31.060.20 : Ceramic and mica capacitors |
| Number of pages | 26 |
| Cross references | ANSI/EIA-970 (2013), IDT |
| Year | 2013 |
| Document history | |
| Country | USA |
| Keyword | EIA 970;970 |