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EIA JESD 22-A101D:2015

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EIA JESD 22-A101D:2015

Steady-State Temperature-Humidity Bias Life Test

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The Steady-State Temperature-Humidity Bias Life Test is performed to evaluate the reliability of nonhermetic packaged IC devices in humid environments. Temperature, humidity, and bias conditions are applied to accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it.

Author EIA
Editor EIA
Document type Standard
Format File
ICS 17.200.01 : Thermodynamics in general
Number of pages 12
Replace EIA JESD 22-A101C (2009-03)
Year 2015
Document history EIA JESD 22-A101D (2015-07)
Country USA
Keyword EIA JESD 22;EIA 22;EIA 22.A101D;22;EIA JESD22-A101D