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The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. Low Temperature storage test is typically used to determine the effect of time and temperature, under storage conditions, for thermally activated failure mechanisms of solid state electronic devices, including nonvolatile memory devices (data retention failure mechanisms). During the test reduced temperatures (test conditions) are used without electrical stress applied. This test may be destructive, depending on Time, Temperature and Packaging (if any).
|ICS|| 35.220.01 : Data storage devices in general |
|Number of pages||10|
|Replace|| EIA JESD 22-A119 (2004-11)|
|Document history|| EIA JESD 22-A119A (2015-10)|
|Keyword||EIA JESD 22;EIA 22;EIA 22.A119A;22;EIA JESD22-A119A|