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EIA JESD 435:1976 (R2009)
Standard for the Measurement of Small-Signal Transistor Scattering ParametersMore info
PREFACE The symbols and terms of this document are contained in JEDEC Publication No. 77 and are not in conflict with those in IEC Publication 147-OC. The measurement procedures are similar to those published in IEC.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2009-03-01 |
| ICS | 31.080.30 : Transistors |
| Number of pages | 29 |
| Year | 1970 |
| Document history | |
| Country | USA |
| Keyword | EIA 435;435;EIA-435;EIA JESD435 |