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This publication covers recommended methods for measurement of transistor lead temperatures under various load conditions. The techniques described are sufficiently accurate for most applications.
| Author | EIA |
|---|---|
| Editor | EIA |
| Document type | Standard |
| Format | File |
| ICS | 31.080.30 : Transistors |
| Number of pages | 12 |
| Replace | EIA JEP 84 (1973) |
| Year | 2004 |
| Document history | EIA JEP 84A (2004-06) |
| Country | USA |
| Keyword | EIA 84A;84A;EIA JEP84A |