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IEC 61300-3-30 Ed. 1.0 b:2003 [ Withdrawn ]Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-30: Examinations and measurements - Polish angle and fibre position on single ferrule multifibre connectorsstandard by International...
IEC 60749-5 Ed. 1.0 b:2003 [ Withdrawn ]Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life teststandard by International Electrotechnical Commission, 01/17/2003
IEC 60216-5 Ed. 2.0 b:2003 [ Withdrawn ]Electrical insulating materials - Thermal endurance properties - Part 5: Determination of relative thermal endurance index (RTE) of an insulating materialstandard by International Electrotechnical Commission, 01/17/2003
IEC 60749-16 Ed. 1.0 b:2003Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)standard by International Electrotechnical Commission, 01/17/2003
IEC 61300-2-1 Ed. 2.0 b:2003Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-1: Tests - Vibration (sinusoidal)standard by International Electrotechnical Commission, 01/16/2003
IEC 60335-2-104 Ed. 1.0 b:2003Household and similar electrical appliances - Safety - Part 2-104: Particular requirements for appliances to recover and/or recycle refrigerant from air conditioning and refrigeration equipmentstandard by International Electrotechnical Commission, 01/15/2003
IEC 61300-3-16 Ed. 2.0 b:2003 [ Withdrawn ]Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-16: Examinations and measurements - Endface radius of spherically polished ferrulesstandard by International Electrotechnical Commission,...
IEC 61300-2-48 Ed. 1.0 b:2003Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cyclingstandard by International Electrotechnical Commission, 01/14/2003
IEC 61000-4-15 Amd.1 Ed. 1.0 b:2003 [ Withdrawn ]Amendment 1 - Electromagnetic compatibility (EMC) - Part 4: Testing and measurement techniques - Section 15: Flickermeter - Functional and design specificationsAmendment by International Electrotechnical Commission, 01/13/2003
IEC 61290-3-2 Ed. 1.0 b:2003 [ Withdrawn ]Optical amplifiers - Part 3-2: Test methods for noise figure parameters - Electrical spectrum analyzer methodstandard by International Electrotechnical Commission, 01/13/2003
IEC 60127-3 Amd.2 Ed. 2.0 b:2002 [ Withdrawn ]Amendment 2 - Miniature fuses - Part 3: Sub-miniature fuse-linksAmendment by International Electrotechnical Commission, 12/20/2002
IEC 61156-1 Ed. 2.0 b:2002 [ Withdrawn ]Multicore and symmetrical pair/quad cables for digital communications - Part 1: Generic specificationstandard by International Electrotechnical Commission, 12/20/2002