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JEDEC JESD37A
JEDEC JESD37ALognormal Analysis of Uncensored Data, and of Singly Right-Censored Data Utilizing the Persson and Rootzen Methodstandard by JEDEC Solid State Technology Association, 08/01/2017
$32.68 $76.00 -57%Reduced price!In stockJEDEC JESD30H
JEDEC JESD30HDescriptive Designation System for Semiconductor-device Packagesstandard by JEDEC Solid State Technology Association, 08/01/2017
$49.88 $116.00 -57%Reduced price!In stockJEDEC JESD214.01
JEDEC JESD214.01CONSTANT-TEMPERATURE AGING METHOD TO CHARACTERIZE COPPER INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDINGstandard by JEDEC Solid State Technology Association, 08/01/2017
$30.96 $72.00 -57%Reduced price!In stockJEDEC JESD22-A108F
JEDEC JESD22-A108FTEMPERATURE, BIAS, AND OPERATING LIFEstandard by JEDEC Solid State Technology Association, 07/01/2017
$23.22 $54.00 -57%Reduced price!In stockJEDEC JESD47J
JEDEC JESD47JSTRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITSstandard by JEDEC Solid State Technology Association, 08/01/2017
$31.82 $74.00 -57%Reduced price!In stockJEDEC JESD224A
JEDEC JESD224AUniversal Flash Storage (UFS) Teststandard by JEDEC Solid State Technology Association, 07/01/2017
$131.15 $305.00 -57%Reduced price!In stock
