




![AS 3850.2-1990 [ Superseded ]](https://www.docuarea.org/109516-cart_default/as-38502-1990-superseded-17.jpg)
![AS 2362.24-1990 [ Superseded ]](https://www.docuarea.org/109522-cart_default/as-236224-1990-superseded-54.jpg)







![AS 3796(INT)-1990 [ Superseded ]](https://www.docuarea.org/109524-cart_default/as-3796int-1990-superseded-41.jpg)
![AS 2243.2-1990 [ Superseded ]](https://www.docuarea.org/109530-cart_default/as-22432-1990-superseded-81.jpg)


![AS 3641.2-1990 [ Superseded ]](https://www.docuarea.org/109508-cart_default/as-36412-1990-superseded-92.jpg)
![AS 3850.1-1990 [ Superseded ]](https://www.docuarea.org/109511-cart_default/as-38501-1990-superseded-7.jpg)


![AS 3696.9-1990 [ Superseded ]](https://www.docuarea.org/109527-cart_default/as-36969-1990-superseded-55.jpg)
No products

BS PD CEN ISO/TR 20659‑2:2024 Rheological test methods. Fundamentals...

BS PD ISO/IEC TS 18013‑7:2024 Historical[ Withdrawn ] Personal...

BS PD ISO/TS 20790:2024 Oil and gas industries including lower carbon...

BS PD CEN ISO/TR 8124‑8:2024 Safety of toys - Age determination. First...

BS PD ISO/IEC TS 8236-2:2025 Information technology. Provisioning,...

BS PD CEN/TR 14380:2024 Lighting applications. Tunnel lighting standard...


BS PD CEN/TR 16389:2025 Automotive fuels. Paraffinic diesel fuel and...
Viewed products
GMW15347 3rd Edition, January 1,...
JIS Z 3221:2013 (R2017) Stainless...
EIA CB-5:1969 Recommended Test Procedure for Semiconductor Thermal Dissipating Devices
EIA-362:1969 Tensile Properties of Magnetic Tape, Recm. Test Method R(1974)
EIA JEP 78:1969 Relative Spectral Response Curves for Semiconductor Infrared Detectors
EIA-365:1969 Performance Test Procedure for Solar Cells and Calibration Procedure for Solar Cell Standards for Space Vehicle Service
EIA-369:1969 Midget I.F. Shields (.75 inch Square) (Reaffirmation of REC-144) R(1982)
EIA JEB 15:1969 Terminology and Methods of Measurement for Bistable Semiconductor Microcircuits
EIA JESD 353:1968 (R2009) The Measurement of Transistor Noise Figure at Frequencies up to 20 kHz by Sinusoidal Signal-Generator Method
EIA JESD 354:1968 (R2009) The Measurement of Transistor Equivalent Noise Voltage and Equivalent Noise Current at Frequencies of up to 20 kHz
EIA RS-348:1968 Magnetic Field Polarity, Including Definitions and Determination of Polarity
EIA-356:1968 Definitions and Terminology in Connection with Record Changers and Manual Phonographs R(1973)
EIA JESD 340:1967 (R2009) Standard for the Measurement of CRE
EIA JESD 6:1967 (R2002) Measurement of Small Values of Transistor Capacitance