Viewed products
SAE AMS4181D...
SAE AS 23053/2:2019-04-08 INSULATION...
EIA JESD 85:2001 (R2014) Methods for Calculating Failure Rates in Units of FITs
EIA JESD 51-11:2001 Test Boards for Through-Hole Area Array Leaded Package Thermal Measurements
EIA JESD 76-1:2001 Standard Description of 1.2 V CMOS Logic Devices (Wide Range Operations)
EIA JESD 76-2:2001 Standard Description of 1.2 V CMOS Logic Devices (Normal Range Operations)
EIA TSB 125:2001 Guidelines for Maintaining Optical Fiber Polarity Through Reverse-Pair Positioning
EIA-540J0AB:2001 Detail Specification for Coin Cell Battery Holders for Use in Electronic Equipment
EIA-364-68A:2001 (R2008) TP-68A Actuating Mechanism Test Procedure for Electrical Connectors
EIA JESD 35-A:2001 Procedure for the Wafer-Level Testing of Thin Dielectrics
EIA-364-19A:2001 (R2008) TP-19A Torsional Insert Retention Test Procedure for Electrical Connectors
EIA-364-47A:2001 (R2008) Conductor Unwrap (Solderless Wrapped Connection) Test Procedure for Electrical Connectors
EIA/TIA-455-58-B:2001 FOTP-58 Core Diameter Measurement of Graded-Index Optical Fibers