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EIA-540B0AE:2000 (R2009)
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EIA-364-66A:2000 (R2013)
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EIA There are 1933 products.
EIA JESD 75-3:2001
EIA JESD 75-3:2001 Ball Grid Array Pinouts Standardized for 8-Bit Logic Functions
$14.00 $32.56 -57%In StockEIA JESD 82-2:2001
EIA JESD 82-2:2001 Desription of a 3.3 V, 18-Bit, LVTTL I/O Register for PC133 Registered DIMM Applications
$21.19 $49.28 -57%In StockEIA JESD 85:2001 (R2014)
EIA JESD 85:2001 (R2014) Methods for Calculating Failure Rates in Units of FITs
$21.29 $49.50 -57%In StockEIA JESD 87:2001
EIA JESD 87:2001 Standard Test Structures for Reliability Assessment of AICu Metallizations with Barrier Materials
$16.27 $37.84 -57%In StockEIA JESD 51-11:2001
EIA JESD 51-11:2001 Test Boards for Through-Hole Area Array Leaded Package Thermal Measurements
$17.03 $39.60 -57%In StockEIA JESD 76-2:2001
EIA JESD 76-2:2001 Standard Description of 1.2 V CMOS Logic Devices (Normal Range Operations)
$14.38 $33.44 -57%In StockEIA JESD 76-1:2001
EIA JESD 76-1:2001 Standard Description of 1.2 V CMOS Logic Devices (Wide Range Operations)
$14.38 $33.44 -57%In StockEIA TSB 125:2001
EIA TSB 125:2001 Guidelines for Maintaining Optical Fiber Polarity Through Reverse-Pair Positioning
$25.35 $58.96 -57%In StockEIA-540J0AB:2001
EIA-540J0AB:2001 Detail Specification for Coin Cell Battery Holders for Use in Electronic Equipment
$33.28 $77.40 -57%In StockEIA-364-68A:2001 (R2008)
EIA-364-68A:2001 (R2008) TP-68A Actuating Mechanism Test Procedure for Electrical Connectors
$27.86 $64.80 -57%In StockEIA JESD 35-A:2001
EIA JESD 35-A:2001 Procedure for the Wafer-Level Testing of Thin Dielectrics
$25.35 $58.96 -57%In StockEIA-364-19A:2001 (R2008)
EIA-364-19A:2001 (R2008) TP-19A Torsional Insert Retention Test Procedure for Electrical Connectors
$27.86 $64.80 -57%In Stock
