Full Description

This technical report provides a comprehensive summary of the state of transient latch-up. It was hoped that by compiling a summary of the state of knowledge on the subject, it would make it clear whether a single transient latch-up test was needed or if a small set of stress tests could cover a large fraction of the integrated circuits which have latch-up sensitivity when exposed to transient signals.

Product Details

Published: 2013 Number of Pages: 67 File Size: 1 file , 1.8 MB