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ESD SP5.3.2-2013
M00000439
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ESD SP5.3.2-2013 Sensitivity Testing - Socketed Device Model (SDM) Component Level
standard by EOS/ESD Association, Inc., 2013
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The purpose of this standard practice is to define a method to verify the correct operational state of the test simulator, describe a procedure for measuring acceptable SDM discharge waveforms, determine critical waveform parameters and their acceptable values, and provide recommendations for device testing and ESD stressing levels.This standard practice defines a method on how to perform component level socketed device model ESD tests and how to verify the operational state of the ESD simulator test equipment. This document is a standard practice and therefore does not provide any device classification guidelines.