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New Reduced price! IEC 62429 Ed. 1.0 b:2007

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IEC 62429 Ed. 1.0 b:2007

Reference: M00000180

Condition: New product

IEC 62429 Ed. 1.0 b:2007 Reliability growth - Stress testing for early failures in unique complex systems

standard by International Electrotechnical Commission, 11/30/2007

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This International Standard gives guidance for reliability growth during final testing or acceptance testing of unique complex systems. It gives guidance on accelerated test conditions and criteria for stopping these tests.

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Edition: 1.0 Published: 11/30/2007 Number of Pages: 71 File Size: 1 file , 1.2 MB