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IEC 60749-23 Amd.1 Ed. 1.0 b:2011
M00000414
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IEC 60749-23 Amd.1 Ed. 1.0 b:2011 Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Amendment by International Electrotechnical Commission, 01/27/2011
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