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IEC 60749-11 Ed. 1.0 b CORR1:2003
M00001027
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IEC 60749-11 Ed. 1.0 b CORR1:2003 Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Corrigenda by International Electrotechnical Commission, 01/30/2003
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