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IEC 60749-14 Ed. 1.0 b:2003

M00000745

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IEC 60749-14 Ed. 1.0 b:2003 Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)

standard by International Electrotechnical Commission, 08/07/2003

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Provides various tests for determining the integrity between the lead/package interface and the lead itself when the lead(s) are bent due to faulty board assembly followed by rework of the part for re-assembly. Applicable to all through-hole devices and surface-mount devices requiring lead forming by the user.

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Edition: 1.0 Published: 08/07/2003 Number of Pages: 27 File Size: 1 file , 570 KB