Could I help you?
> >IEC 60748-20-1 Ed. 1.0 b:1994
New Reduced price! IEC 60748-20-1 Ed. 1.0 b:1994 View larger

IEC 60748-20-1 Ed. 1.0 b:1994

M00001559

New product

IEC 60748-20-1 Ed. 1.0 b:1994 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination

standard by International Electrotechnical Commission, 03/01/1994

More details

In stock

$85.57

-57%

$199.00

More info

Full Description

The purpose of these examinations is to check the internal materials, construction and workmanship of film and hybrid integrated circuits (F and HFICs). These examinations will normally be used prior to tapping or encapsulation to detect and eliminate the F and HFICs with internal defects that could lead to device failure in normal application. Other acceptance criteria may be agreed upon with the purchaser or supplier, respectively.

Product Details

Edition: 1.0 Published: 03/01/1994 Number of Pages: 55 File Size: 1 file , 2 MB