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New Reduced price! IEC 61000-4-29 Ed. 1.0 b:2000 View larger

IEC 61000-4-29 Ed. 1.0 b:2000

M00000259

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IEC 61000-4-29 Ed. 1.0 b:2000 Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

standard by International Electrotechnical Commission, 08/30/2000

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Establishes a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. power ports. This standard defines: - the range of test levels; - the test generator; - the test set-up; - the test procedure.