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IEC 60749-30 Amd.1 Ed. 1.0 b:2011
M00000185
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IEC 60749-30 Amd.1 Ed. 1.0 b:2011 Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Amendment by International Electrotechnical Commission, 05/25/2011
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