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BS IEC 63003:2015
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505$uT$uMMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 978 0 580 91106 4 |
| ICS | 25.040.01 : Industrial automation systems in general |
| Number of pages | 174 |
| Cross references | IEC 63003:2015 |
| Year | 2016 |
| Country | United Kingdom |
| Keyword | BS IEC 63003 ; BSIEC63003 ; BSIEC 63003 ; BS IEC63003 |